Add native unit tests for the Nano firmware

- New native environment: pio test -e native
- test/mocks: fake Arduino core, EEPROM and recording BROSE9323 driver
- test/test_nano: 25 tests covering every command, bitmaps, bad input,
  flip time storage and the periodic full redraw
- Board environments ignore tests so they are never uploaded

Co-Authored-By: Claude Opus 5.5 <noreply@anthropic.com>
This commit is contained in:
mangavalkandClaude Opus 5.5 committed 2026-10-13 00:24:13 +02:00
1 parent 80f3f78152
commit 8415dee347
8 files changed
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// Minimal Arduino API for running the Nano code on the PC (native test environment)
#pragma once
#include <cstdint>
#include <cstdio>
#include <cstdlib>
#include <cstring>
#include <deque>
#include <string>
#define HEX 16
class __FlashStringHelper;
#define F(s) ((const __FlashStringHelper *)(s))
// Time is controlled by the tests
inline uint32_t fake_millis = 0;
inline uint32_t millis() { return fake_millis; }
inline void delay(uint32_t ms) { fake_millis += ms; }
// Serial port: tests push bytes into `in` and read replies from `out`
class FakeSerial
{
public:
std::deque<char> in;
std::string out;
void begin(unsigned long) {}
int available() { return in.size(); }
int read()
{
if (in.empty())
return -1;
char c = in.front();
in.pop_front();
return (uint8_t)c;
}
void flush() {}
void print(const __FlashStringHelper *s) { out += (const char *)s; }
void print(const char *s) { out += s; }
void print(int v, int base = 10)
{
char buf[16];
snprintf(buf, sizeof(buf), base == HEX ? "%X" : "%d", v);
out += buf;
}
void println(const __FlashStringHelper *s) { print(s); out += "\n"; }
void println(const char *s) { print(s); out += "\n"; }
void println(unsigned long v) { out += std::to_string(v) + "\n"; }
};
using Print = FakeSerial;
inline FakeSerial Serial;
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// Fake display driver for the native tests: records every call instead of flipping dots
#pragma once
#include <string>
#include <vector>
#include "Arduino.h"
struct DisplayCall
{
std::string what;
int a, b, c;
};
class BROSE9323
{
public:
std::vector<DisplayCall> calls;
bool direct = false;
BROSE9323(uint8_t, uint8_t, uint8_t, uint16_t) {}
void begin() { log("begin"); }
void display(bool force = false) { log("display", force); }
void drawPixel(int16_t x, int16_t y, uint16_t color) { log(direct ? "directPixel" : "pixel", x, y, color); }
void fillScreen(uint16_t color) { log("fill", color); }
void setDirect(bool d) { direct = d; }
void setTiming(uint16_t t) { log("timing", t); }
void printBuffer() { log("printBuffer"); }
void setCursor(int16_t x, int16_t y) { log("cursor", x, y); }
void setTextColor(uint16_t color, uint16_t background) { log("textColor", color, background); }
void setTextSize(uint8_t size) { log("textSize", size); }
size_t write(uint8_t ch)
{
log("write", ch);
return 1;
}
void println() { log("newline"); }
// Helpers for the tests
int count(const std::string &what) const
{
int n = 0;
for (const DisplayCall &call : calls)
n += call.what == what;
return n;
}
const DisplayCall *last(const std::string &what) const
{
for (auto it = calls.rbegin(); it != calls.rend(); ++it)
if (it->what == what)
return &*it;
return nullptr;
}
private:
void log(const char *what, int a = 0, int b = 0, int c = 0) { calls.push_back({what, a, b, c}); }
};
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// In-memory EEPROM for the native tests (starts erased, all 0xFF like a new chip)
#pragma once
#include <cstdint>
#include <cstring>
class FakeEEPROM
{
public:
uint8_t mem[1024];
FakeEEPROM() { erase(); }
void erase() { memset(mem, 0xFF, sizeof(mem)); }
template <typename T>
T &get(int addr, T &t)
{
memcpy(&t, mem + addr, sizeof(T));
return t;
}
template <typename T>
const T &put(int addr, const T &t)
{
memcpy(mem + addr, &t, sizeof(T));
return t;
}
};
inline FakeEEPROM EEPROM;